Chris Scharff and Hank Spuhler Cover Recent Developments in Patent Damages
11.13.25
On Friday, Nov. 14, at 10:45 a.m. CT, Chris and Hank will participate in the Patent Litigation Module at The Center for American and International Law’s 63rd Annual Conference on Intellectual Property Law in Plano, Texas. Their session will examine recent Federal Circuit rulings affecting patent damages, including the potential for increased awards based on foreign sales, and evolving standards for reasonable royalties. In addition, they will discuss the use of comparable licenses and benchmarks, the use of survey evidence in determining patent damages, and enhanced damages for willful infringement.
Learn more here: https://bit.ly/448GIzg